Class SEMICONDUCTOR


Slots on this class:

Documentation:
A material that has variable conducting properties under different conditions. All micro-circuitry is etched on a semiconducting material (usually silicon).
Instance-Of: Class
Subclass-Of: Electronic-device
Domain-Of:
Available-packages, Maximum-dc-output-level, Maximum-input-voltage, Maximum-junction-temperature, Maximum-lead-temperature, Maximum-operating-supply-voltage, Maximum-output-current-non-repetitive, Maximum-output-current-repetitive, Maximum-package-dissipation-14-pin-dip, Maximum-package-dissipation-8-pin-dip, Maximum-peak-current, Maximum-peak-supply-voltage, Maximum-power-dissipation, Maximum-quiescent-output-voltage, Maximum-quiescent-supply-current, Maximum-supply-voltage, Minimum-dc-output-level, Minimum-quiescent-output-voltage, Minimum-supply-voltage, Typical-bandwidth, Typical-bias-current, Typical-dc-output-level, Typical-input-noise-current, Typical-input-noise-voltage, Typical-input-resistance, Typical-quiescent-output-voltage, Typical-quiescent-supply-current, Typical-short-circuit-current, Typical-total-harmonic-distortion
Range-Of: Devices-with-this-package
Superclass-Of: Integrated-circuit

Other Related Axioms:

(=> (Available-Packages $X $Y) (Semiconductor $X))

(=> (Devices-With-This-Package $X $Y) (Semiconductor $Y))

(=> (Minimum-Supply-Voltage $X $Y) (Semiconductor $X))

(=> (Typical-Total-Harmonic-Distortion $X $Y) (Semiconductor $X))

(=> (Typical-Input-Resistance $X $Y) (Semiconductor $X))

(=> (Maximum-Package-Dissipation-14-Pin-Dip $X $Y)
    (Semiconductor $X))

(=> (Maximum-Package-Dissipation-8-Pin-Dip $X $Y) (Semiconductor $X))

(=> (Maximum-Input-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Supply-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Peak-Current $X $Y) (Semiconductor $X))

(=> (Maximum-Junction-Temperature $X $Y) (Semiconductor $X))

(=> (Maximum-Lead-Temperature $X $Y) (Semiconductor $X))

(=> (Typical-Quiescent-Output-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Quiescent-Output-Voltage $X $Y) (Semiconductor $X))

(=> (Minimum-Quiescent-Output-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Quiescent-Supply-Current $X $Y) (Semiconductor $X))

(=> (Typical-Quiescent-Supply-Current $X $Y) (Semiconductor $X))

(=> (Typical-Bandwidth $X $Y) (Semiconductor $X))

(=> (Typical-Short-Circuit-Current $X $Y) (Semiconductor $X))

(=> (Typical-Bias-Current $X $Y) (Semiconductor $X))

(=> (Maximum-Peak-Supply-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Operating-Supply-Voltage $X $Y) (Semiconductor $X))

(=> (Maximum-Output-Current-Repetitive $X $Y) (Semiconductor $X))

(=> (Maximum-Output-Current-Non-Repetitive $X $Y) (Semiconductor $X))

(=> (Maximum-Power-Dissipation $X $Y) (Semiconductor $X))

(=> (Minimum-Dc-Output-Level $X $Y) (Semiconductor $X))

(=> (Typical-Dc-Output-Level $X $Y) (Semiconductor $X))

(=> (Maximum-Dc-Output-Level $X $Y) (Semiconductor $X))

(=> (Typical-Input-Noise-Voltage $X $Y) (Semiconductor $X))

(=> (Typical-Input-Noise-Current $X $Y) (Semiconductor $X))